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Your search returned 255 patents.
( 714/735 in Current US Classification )
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Patent IDTitleDate Filed
6243843 Post-mission test method for checking the integrity of a boundary scan test January 9, 1995
6243841 Automated test and evaluation sampling system and method May 29, 1998
6230289 Testing data packets October 27, 1998
6223316 Vector restoration using accelerated validation and refinement July 10, 1998
6205567 Fault simulation method and apparatus, and storage medium storing fault simulation program February 26, 1998
6185714 Address trap comparator capable of carrying out high speed fault detecting test June 5, 1998
6173425 Methods of testing integrated circuits to include data traversal path identification information and related status information in test data streams April 15, 1998
6172966 Diagnosis of networks of components, with stripwise modeling January 14, 1998
6158022 Circuit analyzer of black, gray and transparent elements April 13, 1998
6122757 Code generating system for improved pattern matching in a protocol analyzer June 27, 1997
6122755 Method and apparatus for functional test of communication port December 18, 1998
6105155 Method and apparatus for performing on-chip function checks and locating detected anomalies within a nested time interval using CRCs or the like January 21, 1998
6098186 Test permutator May 29, 1998
6076180 Method for testing a controller with random constraints June 23, 1997
6073264 Debug vector launch tool April 2, 1998
6019501 Address generating device for memory tester March 30, 1992
5991903 Parallel bit test circuit for testing a semiconductor device in parallel bits August 11, 1997
5920489 Method and system for modeling the behavior of a circuit May 3, 1996
5903475 System simulation for testing integrated circuit models July 18, 1996
5894483 Integrated circuit arrangement August 19, 1997
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