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Your search returned 860 patents.
( 714/733 in Current US Classification ) |
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| Patent ID | Title | Date Filed |
| 7185251 | Method and apparatus for affecting a portion of an integrated circuit
| May 29, 2002 |
| 7184037 | Virtual environment navigation aid
| November 10, 2005 |
| 7183792 | Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same
| April 1, 2003 |
| 7181659 | Memory built-in self test engine apparatus and method with trigger on failure and multiple patterns per load capability
| February 10, 2005 |
| 7181658 | Method for testing semiconductor memory device and test circuit for semiconductor memory device
| November 24, 2003 |
| 7178077 | Integrated circuit test apparatus
| August 13, 2004 |
| 7178076 | Architecture of an efficient at-speed programmable memory built-in self test
| June 16, 2004 |
| 7174486 | Automation of fuse compression for an ASIC design system
| November 22, 2002 |
| 7171601 | Programmable jitter generator
| August 21, 2003 |
| 7171596 | Circuit and method for testing embedded DRAM circuits through direct access mode
| September 11, 2002 |
| 7170308 | On-chip voltage regulator using feedback on process/product parameters
| July 28, 2003 |
| 7168021 | Built-in test circuit for an integrated circuit device
| February 1, 2005 |
| 7168005 | Programable multi-port memory BIST with compact microcode
| January 30, 2003 |
| 7167404 | Method and device for testing configuration memory cells in programmable logic devices (PLDS)
| May 13, 2003 |
| 7155648 | Linear feedback shift register reseeding
| September 19, 2003 |
| 7155351 | Method for verifying the calculator core of a microprocessor or a microcontroller
| July 30, 2002 |
| 7152186 | Cross-triggering of processing devices
| August 4, 2003 |
| 7149943 | System for flexible embedded Boundary Scan testing
| January 12, 2004 |
| 7149939 | Method of testing the data exchange functionality of a memory
| April 26, 2002 |
| 7146547 | Semiconductor device
| December 10, 2003 |
| 7146539 | Systems and methods for testing a device-under-test
| July 15, 2003 |
| 7143325 | Method for testing circuit units to be tested by means of majority decisions and test device for performing the method
| October 1, 2004 |
| 7139943 | Method and apparatus for providing adjustable latency for test mode compression
| March 29, 2002 |
| 7137050 | Compression circuit for testing a memory device
| November 13, 2003 |
| 7134063 | Apparatus and method for testing on-chip ROM
| June 12, 2003 |
| 7133797 | Method, apparatus, system, program and medium for inspecting a circuit board and an apparatus incorporating the circuit board
| September 30, 2004 |
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