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Your search returned 201 patents.
( 714/729 in Current US Classification )
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Patent IDTitleDate Filed
6754863 Scan interface chip (SIC) system and method for scan testing electronic systems April 4, 2000
6751764 Method and apparatus for testing and debugging a circuit July 19, 2001
6748564 Scan stream sequencing for testing integrated circuits October 24, 2000
6745355 Semiconductor integrated circuit April 1, 1999
6742152 Parallel scan test software April 11, 2001
6742151 Semiconductor integrated circuit device with scan signal converting circuit January 8, 2001
6738963 Dynamically reconfiguring clock domains on a chip June 28, 2002
6728915 IC with shared scan cells selectively connected in scan path January 10, 2001
6728814 Reconfigurable IEEE 1149.1 bus interface February 9, 2000
6728652 Method of testing electronic components and testing apparatus for electronic components August 18, 1999
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