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Your search returned 253 patents.
( 714/725 in Current US Classification )
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Patent IDTitleDate Filed
6625769 Method for IC fault analysis using programmable built-in self test and optical emission November 1, 2000
6622272 Automatic test equipment methods and apparatus for interfacing with an external device March 10, 2000
6614259 Configuration memory integrated circuit March 21, 2001
6603331 Low-voltage non-degenerative transmitter circuit December 18, 2001
6594610 Fault emulation testing of programmable logic devices May 11, 2001
6590416 Supply voltage independent ramp-up circuit December 18, 2001
6574761 On-line testing of the programmable interconnect network in field programmable gate arrays September 27, 1999
6556044 Programmable logic device including multipliers and configurations thereof to reduce resource utilization September 18, 2001
6553527 Programmable array built-in self test method and controller with programmable expect generator November 8, 1999
6553523 System and method for verifying configuration of a programmable logic device August 13, 1999
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