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| Patent ID | Title | Date Filed |
| 7043673 | Content addressable memory with priority-biased error detection sequencing
| November 1, 2001 |
| 7043617 | System supporting multiple memory modes including a burst extended data out mode
| February 22, 2000 |
| 7036053 | Two dimensional data eye centering for source synchronous data transfers
| December 19, 2002 |
| 7032144 | Method and apparatus for testing multi-port memories
| April 28, 2003 |
| 7020806 | Method for testing memory units to be tested and test device
| August 22, 2002 |
| 7013414 | Test method and test system for semiconductor device
| December 27, 2001 |
| 7013413 | Method for compressing output data and a packet command driving type memory device
| June 27, 2000 |
| 7003706 | Method, system, and program for improved device blocking and suspension
| May 27, 2003 |
| 6986084 | Apparatus and method for reducing test resources in testing DRAMS
| June 29, 2004 |
| 6986083 | Method and/or apparatus for SCSI target verification
| April 15, 2002 |
| 6983402 | Computer device
| December 10, 2001 |
| 6981188 | Non-volatile memory device with self test
| August 16, 2001 |
| 6978405 | Memory device with comparison units to check functionality of addressed memory cells
| November 13, 2000 |
| 6970806 | Method and system for testing articles of manufacture
| November 7, 2003 |
| 6968483 | Circuit and method for testing a data memory
| October 15, 2001 |
| 6958873 | Data rewrite control in data transfer and storage apparatus
| July 31, 2001 |
| 6934900 | Test pattern generator for SRAM and DRAM
| June 25, 2001 |
| 6934895 | I/O compression circuit for a semiconductor memory device
| April 29, 2002 |
| 6930936 | Data compression read mode for memory testing
| August 30, 2001 |
| 6918072 | Circuit and method for time-efficient memory repair
| May 24, 2001 |
| 6917213 | Semiconductor integrated circuit device
| July 10, 2003 |
| 6915468 | Apparatus for testing computer memory
| August 8, 2001 |
| 6914447 | High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments
| April 23, 2003 |
| 6910155 | System and method for chip testing
| June 25, 2001 |
| 6909651 | Method and apparatus for testing a CAM addressed cache
| March 17, 2004 |
| 6907555 | Self-test circuit and memory device incorporating it
| October 19, 2000 |
| 6904552 | Circuit and method for test and repair
| March 15, 2001 |
| 6901542 | Internal cache for on chip test data storage
| August 9, 2001 |
| 6877118 | Memory testing method and memory testing apparatus
| April 27, 2001 |
| 6858447 | Method for testing semiconductor chips
| May 21, 2002 |
| 6857088 | Method and system for testing the logic of a complex digital circuit containing embedded memory arrays
| December 6, 2000 |
| 6854079 | Apparatus and method for reducing test resources in testing Rambus DRAMs
| August 31, 2000 |
| 6845407 | Semiconductor memory device having externally controllable data input and output mode
| July 24, 2000 |
| 6842866 | Method and system for analyzing bitmap test data
| October 25, 2002 |
| 6842864 | Method and apparatus for configuring access times of memory devices
| October 5, 2000 |
| 6836863 | Semiconductor memory testing method and apparatus
| August 8, 2001 |
| 6829739 | Apparatus and method for data buffering
| August 10, 2000 |
| 6823485 | Semiconductor storage device and test system
| April 25, 2001 |
| 6804796 | Method and test tool for verifying the functionality of a software based unit
| April 18, 2001 |
| 6804760 | Method for determining a type of memory present in a system
| June 1, 1995 |
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