| 1 2 3 4 |
| Patent ID | Title | Date Filed |
| 6999835 | Circuit-substrate working system and electronic-circuit fabricating process
| July 18, 2002 |
| 6996484 | Sequential unique marking
| August 11, 2004 |
| 6993458 | Method and apparatus for preprocessing technique for forecasting in capacity management, software rejuvenation and dynamic resource allocation applications
| November 7, 2000 |
| 6993457 | Failed component search technique
| December 17, 2003 |
| 6993404 | Graphical user interface with process quality indicator
| July 11, 2003 |
| 6990421 | Method of displaying measurement result in inspection process and system thereof, and computer program
| October 1, 2003 |
| 6990416 | Qualification signal measurement, trigger, and/or display system
| August 11, 2003 |
| 6988011 | Method and system for analyzing operational parameter data for diagnostics and repairs
| October 16, 2003 |
| 6975967 | CO.sub.2 /O.sub.2 incubator predictive failure for CO.sub.2 and O.sub.2 sensors
| July 31, 2001 |
| 6973396 | Method for developing a unified quality assessment and providing an automated fault diagnostic tool for turbine machine systems and the like
| May 28, 2004 |
| 6965310 | Remote notification method
| October 3, 2003 |
| 6963812 | Product market quality information analyzing back up apparatus, product market quality information analyzing back up system and program for product market quality information analyzing back up
| July 3, 2002 |
| 6960927 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process
| May 12, 2003 |
| 6957159 | System for analyzing compound structure
| August 19, 2003 |
| 6954709 | Signal processing circuit outputting a signal representing the number of times an input signal rises in a predetermined period as a signal corresponding to a quality of the input signal
| August 23, 2002 |
| 6950777 | Method and system for assessing pulp and paper mill performance
| July 29, 2003 |
| 6950767 | Quality monitoring system for building structure, quality monitoring method for building structure and semiconductor integrated circuit device
| November 14, 2003 |
| 6950766 | Plant monitoring apparatus and storage medium
| December 10, 2002 |
| 6947870 | Neural network model for electric submersible pump system
| August 18, 2003 |
| 6944556 | Circuits and methods for current measurements referred to a precision impedance
| November 1, 2001 |
| 6941365 | Computer resource allocation layout description
| July 3, 2001 |
| 6937965 | Statistical guardband methodology
| March 7, 2000 |
| 6931356 | System for dynamically adjusting performance measurements according to provided service level
| March 18, 2003 |
| 6931337 | Lithography tool image quality evaluating and correcting
| June 24, 2003 |
| 6928395 | Method and system for dynamic learning through a regression-based library generation process
| May 27, 2004 |
| 6928394 | Method for dynamically adjusting performance measurements according to provided service level
| March 18, 2003 |
| 6928375 | Inspection condition setting program, inspection device and inspection system
| April 10, 2003 |
| 6909931 | Method and system for estimating microelectronic fabrication product yield
| June 4, 2002 |
| 6907369 | Method and apparatus for modifying design constraints based on observed performance
| May 2, 2003 |
| 6901347 | Availability, reliability or maintainability index including outage characterization
| February 22, 2000 |
| 6898539 | Method for analyzing final test parameters
| August 29, 2003 |
| 6895350 | Fraction defective estimating method, system for carrying out the same recording medium
| February 13, 2003 |
| 6892154 | Method and apparatus for developing multiple test cases from a base test case
| May 6, 2002 |
| 6889149 | System and method for fingerprinting of semiconductor processing tools
| April 25, 2003 |
| 6885955 | Semiconductor process yield analysis based on evaluation of parametric relationship
| March 28, 2003 |
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