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Your search returned 289 patents.
( 702/118 in Current US Classification ) |
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| 1 2 3 |
| Patent ID | Title | Date Filed |
| 6978216 | Testing of integrated circuits from design documentation
| November 7, 2003 |
| 6977900 | Site-to-site dynamic virtual local area network
| August 26, 2003 |
| 6975954 | Functional testing of logic circuits that use high-speed links
| June 24, 2003 |
| 6975952 | Apparatus and method for planning bus systems
| May 8, 2000 |
| 6973406 | Apparatus and method for electrical testing of electrical circuits
| December 18, 2003 |
| 6973402 | System for testing integrated circuits
| June 16, 2004 |
| 6961669 | De-embedding devices under test
| July 31, 2003 |
| 6947864 | Latent fault detection in redundant power supply systems
| June 4, 2003 |
| 6944567 | Method in an integrated circuit (IC) manufacturing process for identifying and redirecting ICs mis-processed during their manufacture
| June 19, 2003 |
| 6941232 | Method and apparatus for performing multi-site integrated circuit device testing
| February 14, 2003 |
| 6937956 | Testing unit and self-evaluating device
| May 19, 2003 |
| 6934656 | Auto-linking of function logic state with testcase regression list
| November 4, 2003 |
| 6931346 | Method and apparatus for reduced pin count package connection verification
| December 30, 2003 |
| 6931296 | Algorithms tunning for dynamic lot dispatching in wafer and chip probing
| September 26, 2003 |
| 6928377 | Self-test architecture to implement data column redundancy in a RAM
| September 9, 2003 |
| 6928376 | Apparatus and methods for ferroelectric ram fatigue testing
| October 3, 2002 |
| 6925429 | Electric wiring simulation device and recording medium recording simulation program for electric wiring simulation device
| July 3, 2001 |
| 6924651 | Printed board inspecting apparatus
| August 6, 2002 |
| 6920407 | Method and apparatus for calibrating a multiport test system for measurement of a DUT
| April 7, 2004 |
| 6918098 | Random code generation using genetic algorithms
| July 16, 2002 |
| 6903566 | Semiconductor device tester
| April 27, 2004 |
| 6898546 | METHOD FOR PROCESSING DATA REPRESENTING PARAMETERS RELATING TO A PLURALITY OF COMPONENTS OF AN ELECTRICAL CIRCUIT, COMPUTER READABLE STORAGE MEDIUM AND DATA PROCESSING SYSTEM CONTAINING COMPUTER-EXECUTABLE INSTRUCTIONS FOR PERFORMING THE METHOD
| October 31, 2002 |
| 1 2 3 |
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