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Your search returned 636 patents.
( 702/117 in Current US Classification ) |
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| Patent ID | Title | Date Filed |
| 7133818 | Method and apparatus for accelerated post-silicon testing and random number generation
| April 17, 2003 |
| 7133799 | Printhead assembly with composite support beam for a pagewidth printhead
| January 12, 2006 |
| 7133798 | Monitoring signals between two integrated circuit devices within a single package
| October 18, 2004 |
| 7133797 | Method, apparatus, system, program and medium for inspecting a circuit board and an apparatus incorporating the circuit board
| September 30, 2004 |
| 7130233 | Sensing circuit for single bit-line semiconductor memory device
| February 1, 2005 |
| 7127652 | X-tree test method and apparatus in a multiplexed digital system
| June 3, 2003 |
| 7120551 | Method for estimating EMI in a semiconductor device
| February 9, 2005 |
| 7119549 | Output calibrator with dynamic precision
| February 25, 2003 |
| 7117112 | Method and system for the interactive testing of assembled wireless communication devices
| September 22, 2004 |
| 7113881 | Method and apparatus for semi-automatic extraction and monitoring of diode ideality in a manufacturing environment
| November 4, 2004 |
| 7113880 | Video testing via pixel comparison to known image
| February 4, 2004 |
| 7112982 | Method for evaluating semiconductor device
| July 28, 2004 |
| 7111198 | Multithread auto test method
| June 12, 2003 |
| 7110905 | Universal automated circuit board tester
| April 9, 2004 |
| 7107171 | Production procedure with PCB calibration
| July 16, 2004 |
| 7103860 | Verification of embedded test structures in circuit designs
| January 23, 2003 |
| 7103512 | USB eye pattern test mode
| January 3, 2005 |
| 7103505 | Defect analyzer
| November 12, 2003 |
| 7103495 | System and method for burn-in test control
| September 17, 2004 |
| 7103494 | Circuit arrangement and data processing method
| June 10, 2004 |
| 7103493 | Memory testing apparatus and method
| May 24, 2004 |
| 7103488 | Method for determining fringing capacitances on passive devices within an integrated circuit
| July 16, 2004 |
| 7102357 | Determination of worst case voltage in a power supply loop
| March 22, 2004 |
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