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| Patent ID | Title | Date Filed |
| 7228470 | Semiconductor testing circuit, semiconductor storage device, and semiconductor testing method
| January 26, 2004 |
| 7228468 | Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification
| November 30, 2004 |
| 7227810 | Semiconductor device and testing method for semiconductor device
| November 1, 2005 |
| 7227797 | Hierarchical memory correction system and method
| August 30, 2005 |
| 7227772 | Method and apparatus for testing tunnel magnetoresistive effect element
| March 3, 2005 |
| 7225379 | Circuit and method for testing semiconductor device
| February 25, 2005 |
| 7225097 | Methods and apparatus for memory calibration
| July 28, 2005 |
| 7224628 | Adaptive algorithm for MRAM manufacturing
| July 13, 2006 |
| 7224627 | Integrated semiconductor circuit and method for testing the same
| April 7, 2005 |
| 7224598 | Programming of programmable resistive memory devices
| September 2, 2004 |
| 7222274 | Testing and repair methodology for memories having redundancy
| February 25, 2004 |
| 7222273 | Apparatus and method for testing semiconductor memory devices, capable of selectively changing frequencies of test pattern signals
| July 7, 2004 |
| 7221603 | Defective block handling in a flash memory device
| May 12, 2005 |
| 7219285 | Flash memory
| June 24, 2003 |
| 7219276 | Testing CMOS CAM with redundancy
| October 7, 2003 |
| 7219272 | Semiconductor integrated circuit with memory redundancy circuit
| June 14, 2002 |
| 7218551 | Multiple level cell memory device with single bit per cell, re-mappable memory block
| May 4, 2006 |
| 7218546 | Integrated circuit device provided with series-connected TC parallel unit ferroelectric memory and method for testing the same
| April 20, 2005 |
| 7216271 | Testing apparatus and a testing method
| April 1, 2005 |
| 7215134 | Apparatus for determining burn-in reliability from wafer level burn-in
| May 16, 2005 |
| 7213186 | Memory built-in self test circuit with full error mapping capability
| January 12, 2004 |
| 7212456 | Apparatus for dynamically repairing a semiconductor memory
| August 16, 2005 |
| 7212455 | Decoder of semiconductor memory device
| September 6, 2005 |
| 7212453 | Semiconductor memory having an error correction function
| June 20, 2005 |
| 7210085 | Method and apparatus for test and repair of marginally functional SRAM cells
| December 2, 2003 |
| 7206252 | Circuit and method for generating word line control signals and semiconductor memory device having the same
| May 31, 2005 |
| 7206239 | Semiconductor device and skew adjusting method
| October 28, 2005 |
| 7206238 | Integrated semiconductor memory comprising at least one word line and method
| September 1, 2005 |
| 7206237 | Apparatus and method for testing a memory device with multiple address generators
| April 28, 2005 |
| 7203874 | Error detection, documentation, and correction in a flash memory device
| May 8, 2003 |
| 7203109 | Device and method for detecting corruption of digital hardware configuration
| December 21, 2005 |
| 7203108 | Reliability test method for a ferroelectric memory device
| September 19, 2005 |
| 7203106 | Integrated semiconductor memory with redundant memory cells
| July 26, 2005 |
| 7203091 | Semiconductor integrated circuit device and non-volatile memory system using the same
| April 4, 2005 |
| 7202681 | Motherboard memory slot ribbon cable and apparatus
| August 27, 2004 |
| 7200786 | Built-in self-analyzer for embedded memory
| December 30, 2003 |
| 7200780 | Semiconductor memory including error correction function
| December 15, 2003 |
| 7200690 | Memory access system providing increased throughput rates when accessing large volumes of data by determining worse case throughput rate delays
| April 22, 2004 |
| 7200059 | Semiconductor memory and burn-in test method of semiconductor memory
| October 28, 2005 |
| 7200058 | Semiconductor memory device
| June 15, 2005 |
| 7200057 | Test for weak SRAM cells
| March 3, 2004 |
| 7197678 | Test circuit and method for testing an integrated memory circuit
| July 3, 2003 |
| 7196952 | Column/sector redundancy CAM fast programming scheme using regular memory core array in multi-plane flash memory device
| December 7, 2005 |
| 7194667 | System for storing device test information on a semiconductor device using on-device logic for determination of test results
| March 5, 2004 |
| 7193918 | Process for refreshing a dynamic random access memory and corresponding device
| January 26, 2004 |
| 7193917 | Semiconductor storage device, test method therefor, and test circuit therefor
| December 10, 2002 |
| 7193882 | Semiconductor memory device
| December 29, 2005 |
| 7193877 | Content addressable memory with reduced test time
| October 21, 2005 |
| 7191379 | Magnetic memory with error correction coding
| September 10, 2003 |
| 7190625 | Method and apparatus for data compression in memory devices
| August 31, 2005 |
| 7190606 | Test mode control device using nonvolatile ferroelectric memory
| December 9, 2003 |
| 7188291 | Circuit and method for testing a circuit having memory array and addressing and control unit
| July 12, 2004 |
| 7187604 | Semiconductor memory
| December 2, 2005 |
| 7187603 | Semiconductor memory device, repair search method, and self-repair method
| February 10, 2004 |
| 7187602 | Reducing memory failures in integrated circuits
| June 13, 2003 |
| 7187599 | Integrated circuit chip having a first delay circuit trimmed via a second delay circuit
| May 25, 2005 |
| 7187195 | Parallel compression test circuit of memory device
| December 10, 2004 |
| 7185245 | Test reading apparatus for memories
| June 17, 2004 |
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