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Your search returned 363 patents.
( 326/16 in Current US Classification ) |
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| Patent ID | Title | Date Filed |
| 6681361 | Semiconductor device inspection apparatus and semiconductor device inspection method
| May 5, 2000 |
| 6680622 | Method and system for disabling a scanout line of a register flip-flop
| May 14, 2002 |
| 6665624 | Generating and using calibration information
| March 2, 2001 |
| 6664803 | Method and apparatus for selecting an encryption integrated circuit operating mode
| June 20, 2002 |
| 6650139 | Modular collection of spare gates for use in hierarchical integrated circuit design process
| June 20, 2001 |
| 6639426 | Apparatus for testing simultaneous bi-directional I/O circuits
| October 29, 2001 |
| 6639422 | Multi-clock integrated circuit with clock generator and bi-directional clock pin arrangement
| February 22, 2002 |
| 6631467 | Microcomputer timing control circuit provided with internal reset signal generator triggered by external reset signal
| August 7, 2000 |
| 6628141 | Integrated circuit having a scan register chain
| November 13, 2000 |
| 6621299 | Control circuit for power
| May 4, 2001 |
| 6614263 | Method and circuitry for controlling clocks of embedded blocks during logic bist test mode
| April 19, 2002 |
| 6603331 | Low-voltage non-degenerative transmitter circuit
| December 18, 2001 |
| 6591388 | High speed sink/source register to reduce level sensitive scan design test time
| April 18, 2000 |
| 6590416 | Supply voltage independent ramp-up circuit
| December 18, 2001 |
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