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Your search returned 2837 patents.
( 324/765 in Current US Classification ) |
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| Patent ID | Title | Date Filed |
| 7221170 | Semiconductor test circuit
| February 1, 2006 |
| 7221147 | Method and socket assembly for testing ball grid array package in real system
| January 23, 2006 |
| 7219422 | Fabrication method of semiconductor integrated circuit device
| January 29, 2004 |
| 7219286 | Built off self test (BOST) in the kerf
| May 22, 2002 |
| 7218093 | Reduced chip testing scheme at wafer level
| August 4, 2003 |
| 7217579 | Voltage contrast test structure
| December 19, 2002 |
| 7215590 | Semiconductor die with process variation compensated operating voltage
| July 21, 2005 |
| 7215134 | Apparatus for determining burn-in reliability from wafer level burn-in
| May 16, 2005 |
| 7215133 | Contactless circuit testing for adaptive wafer processing
| January 30, 2004 |
| 7215132 | Integrated circuit and circuit board
| August 26, 2005 |
| 7215131 | Segmented contactor
| June 7, 1999 |
| 7215128 | Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit
| January 9, 2006 |
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