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Your search returned 2365 patents.
( 324/754 in Current US Classification ) |
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| 1 2 3 4 5 6 7 8 9 10 ... |
| Patent ID | Title | Date Filed |
| 7227370 | Semiconductor inspection apparatus and manufacturing method of semiconductor device
| November 10, 2005 |
| 7227369 | Micro probe 2
| August 18, 2005 |
| 7227368 | Testing head contact probe with an eccentric contact tip
| March 24, 2005 |
| 7224828 | Time resolved non-invasive diagnostics system
| June 9, 2003 |
| 7224175 | Probe mark reading device and probe mark reading method
| February 17, 2006 |
| 7224173 | Electrical bias electrical test apparatus and method
| October 1, 2003 |
| 7221179 | Bendable conductive connector
| December 17, 2004 |
| 7221174 | Probe holder for testing of a test device
| April 18, 2006 |
| 7221173 | Method and structures for testing a semiconductor wafer prior to performing a flip chip bumping process
| September 29, 2004 |
| 7221172 | Switched suspended conductor and connection
| March 5, 2004 |
| 7221171 | Enhanced subsurface membrane interface probe (MIP)
| September 22, 2003 |
| 7219422 | Fabrication method of semiconductor integrated circuit device
| January 29, 2004 |
| 7219418 | Method to prevent damage to probe card
| May 26, 2005 |
| 7218131 | Inspection probe, method for preparing the same, and method for inspecting elements
| March 7, 2005 |
| 7218130 | Bottom side stiffener probe card
| August 25, 2004 |
| 7218127 | Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component
| February 18, 2004 |
| 7215131 | Segmented contactor
| June 7, 1999 |
| 7212019 | Probe needle for testing semiconductor chips and method for producing said probe needle
| April 15, 2004 |
| 7212018 | Dual tip probe
| October 21, 2004 |
| 7212013 | Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
| March 18, 2005 |
| 7211155 | Apparatuses and methods for cleaning test probes
| November 16, 2004 |
| 7208971 | Manual probe carriage system and method of using the same
| January 18, 2005 |
| 7208966 | Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe
| May 25, 2005 |
| 7208965 | Planar view TEM sample preparation from circuit layer structures
| December 23, 2004 |
| 7208964 | Probe card
| May 5, 2004 |
| 7208959 | Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
| November 7, 2005 |
| 7208936 | Socket lid and test device
| April 12, 2004 |
| 7202685 | Embedded probe-enabling socket with integral probe structures
| November 30, 2005 |
| 7202680 | Touch probe
| February 21, 2006 |
| 7202679 | Contactor having conductive particles in a hole as a contact electrode
| January 9, 2006 |
| 7202678 | Resistive probe tips
| December 17, 2004 |
| 7202677 | Socket for mating with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component
| December 30, 2003 |
| 7196532 | Test probe for semiconductor package
| June 6, 2005 |
| 7196531 | Method of manufacturing a probe card
| March 4, 2005 |
| 7196530 | Device testing contactor, method of producing the same, and device testing carrier
| September 26, 2003 |
| 7190182 | Test probe for finger tester and corresponding finger tester
| May 4, 2005 |
| 7190181 | Probe station having multiple enclosures
| November 3, 2004 |
| 7190180 | Anisotropic conductive connector and production method therefor and inspection unit for circuit device
| January 15, 2004 |
| 7190179 | Contact probe
| April 10, 2002 |
| 7189092 | Modular semiconductor package testing contactor system
| July 8, 2005 |
| 7187165 | Method and system for implicitly encoding preferred probing locations in a printed circuit board design for use in tester fixture build
| December 10, 2004 |
| 7187164 | Apparatus for calibrating a probe station
| August 19, 2004 |
| 7183783 | Method and apparatus for pad aligned multiprobe wafer testing
| February 24, 2006 |
| 7183782 | Stage for placing target object
| October 1, 2004 |
| 7183781 | Incorporation of isolation resistor(s) into probes using probe tip spring pins
| August 13, 2004 |
| 7180318 | Multi-pitch test probe assembly for testing semiconductor dies having contact pads
| October 15, 2004 |
| 7180316 | Probe head with machined mounting pads and method of forming same
| February 3, 2006 |
| 7180315 | Substrate with patterned conductive layer
| June 24, 2005 |
| 7180314 | Self-calibrating electrical test probe calibratable while connected to an electrical component under test
| March 21, 2005 |
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