| 1 2 3 4 5 6 7 8 9 |
| Patent ID | Title | Date Filed |
| 6933730 | Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies
| October 9, 2003 |
| 6933729 | Method and apparatus for measuring on-chip power supply integrity
| March 15, 2001 |
| 6929963 | Semiconductor component and method of manufacture and monitoring
| February 5, 2003 |
| 6922062 | Timing markers for the measurement and testing of the controlled impedance of a circuit board
| January 2, 2003 |
| 6921672 | Test structures and methods for inspection of semiconductor integrated circuits
| January 7, 2003 |
| 6917194 | External verification of package processed linewidths and spacings in semiconductor packages
| August 27, 2003 |
| 6917170 | Power window apparatus
| April 22, 2004 |
| 6909275 | Electrical circuit for driving a load
| February 20, 2004 |
| 6904375 | Method and circuits for testing high speed devices using low speed ATE testers
| January 22, 2003 |
| 6903360 | Method for detecting missing components at electrical board test using optoelectronic fixture-mounted sensors
| October 16, 2002 |
| 6894524 | Daisy chain gang testing
| October 23, 2003 |
| 6894503 | Preconditional quiescent current testing of a semiconductor device
| August 7, 2003 |
| 6891392 | Substrate impedance measurement
| February 21, 2003 |
| 6891132 | Shutters for burn-in-board connector openings
| October 9, 2003 |
| 6888454 | Fault diagnosis circuit for LED indicating light
| January 28, 2003 |
| 6885197 | Indexing rotatable chuck for a probe station
| May 28, 2004 |
| 6882159 | Associated grouping of embedded cores for manufacturing test
| November 25, 2003 |
| 6879925 | Metal interconnect reliability evaluation device, method thereof, and recording medium storing program for evaluating reliability of metal interconnect
| January 18, 2002 |
| 6876192 | Testing system in a circuit board manufacturing line for a automatic testing of circuit boards
| March 19, 2003 |
| 6861863 | Inspection apparatus for conductive patterns of a circuit board, and a holder thereof
| October 17, 2001 |
| 6856139 | Apparatus for autonomous activation of system/chassis cooling fan
| May 24, 2002 |
| 6850075 | SRAM self-timed write stress test mode
| December 22, 2000 |
| 6844746 | Electrical system like a testing system for testing the channels of a communication system
| November 26, 2002 |
| 6842028 | Apparatus for testing reliability of interconnection in integrated circuit
| January 27, 2004 |
| 6836260 | Light emitting flat-panel display
| July 31, 2001 |
| 6836124 | Capacitance monitoring systems
| November 12, 2002 |
| 6831466 | Method and system for sensor fault detection
| June 5, 2001 |
| 6829553 | Method of and apparatus for measuring the correctness of and correcting an automatic test arrangement
| March 30, 2001 |
| 6825673 | Method and apparatus for circuit board continuity test, tool for continuity test, and recording medium
| May 23, 2002 |
| 6822259 | Method of detecting and distinguishing stack gate edge defects at the source or drain junction
| April 19, 2002 |
| 6820794 | Solderless test interface for a semiconductor device package
| December 27, 2002 |
| 6819114 | Monitor having a self testing circuit
| January 19, 2001 |
| 6813578 | Process for measuring CMOS device performance from hot carrier luminescence
| February 10, 2003 |
| 6813537 | Connection error detection and response
| November 21, 2002 |
| 6812728 | Test method of internal connections in a semiconductor package
| August 28, 2003 |
| 6809540 | Integrated circuit test structure
| December 11, 2001 |
| 6807495 | Plausibility checking of voltage transformers in substations
| February 26, 2003 |
| 6798185 | Method and apparatus for testing analog to digital converters
| June 28, 2002 |
| 6791341 | Current derivative sensor
| August 12, 2002 |
| 6788403 | Checking machine for checking tape automated bonding region of display module
| October 18, 2001 |
| 6787801 | Wafer with additional circuit parts in the kerf area for testing integrated circuits on the wafer
| September 19, 2002 |
| 6774647 | Noninvasive optical method and system for inspecting or testing CMOS circuits
| February 7, 2002 |
| 6771090 | Indexing rotatable chuck for a probe station
| June 24, 2002 |
| 6771077 | Method of testing electronic devices indicating short-circuit
| April 19, 2002 |
| 6768316 | Laser cutting of laminates for electrical insulation testing
| December 11, 2002 |
| 6768313 | Method for detecting tracking short
| July 30, 2002 |
| 6762608 | Apparatus and method for testing fuses
| June 25, 2002 |
| 6762431 | Wafer-level package with test terminals
| March 12, 2001 |
| 6759859 | Resilient and rugged multi-layered probe
| December 19, 2001 |
| 6759844 | Hall sensor component
| May 23, 2002 |
| 1 2 3 4 5 6 7 8 9 |