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Your search returned 1047 patents.
( 250/492.1 in Current US Classification )
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Patent IDTitleDate Filed
7180071 Integrated circuit having radiation sensor arrangement September 28, 2004
7173686 Offner imaging system with reduced-diameter reflectors September 2, 2004
7173261 Image noise removing method in FIB/SEM complex apparatus February 16, 2005
7173260 Removing byproducts of physical and chemical reactions in an ion implanter December 22, 2004
7173252 Ionizer and method for gas-cluster ion-beam formation October 25, 2005
7167232 Lithographic apparatus and radiation source comprising a debris-mitigation system and method for mitigating debris particles in a lithographic apparatus December 30, 2003
7160475 Fabrication of three dimensional structures November 21, 2002
7154105 Method of exposing using electron beam February 25, 2005
7154103 Method of providing extended shelf life fresh meat products July 22, 2003
7154090 Method for controlling charged particle beam, and charged particle beam apparatus May 12, 2005
7151588 Lithographic apparatus and a method of compensating for thermal deformation in a lithographic apparatus September 2, 2004
7151271 System and method for passing high energy particles through a mask October 8, 2003
7150806 Spiral-shaped lamp for UV curing of coatings and bonding for a digital versatile disk (DVD) or compact disk (CD) January 11, 2002
7148949 Lithographic apparatus and device manufacturing method September 11, 2003
7148494 Level sensor, lithographic apparatus and device manufacturing method December 29, 2004
7145632 Cooling apparatus September 23, 2005
7145155 Process for electron sterilization of a container March 5, 2003
7141809 Method for reciprocating a workpiece through an ion beam April 5, 2005
7141807 Nanowire capillaries for mass spectrometry October 22, 2004
7138641 Beam deflecting method, beam deflector for scanning, ion implantation method, and ion implantation system May 31, 2005
7138629 Testing apparatus using charged particles and device manufacturing method using the testing apparatus January 12, 2004
7135693 Method and apparatus for recycling gases used in a lithography tool June 29, 2005
7135692 Lithographic apparatus, illumination system and method for providing a projection beam of EUV radiation December 4, 2003
7135691 Reciprocating drive for scanning a workpiece through an ion beam April 5, 2005
7133140 Apparatus and measurement procedure for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror like surfaces April 1, 2004
7132674 Collimator for high-energy radiation and program for controlling said collimator October 23, 2002
7129506 Optically detectable security feature April 12, 2004
7129484 Method for pattern recognition in energized charge particle beam wafer/slider inspection/measurement systems in presence of electrical charge January 21, 2004
7126137 Illumination system with field mirrors for producing uniform scanning energy April 20, 2004
7124651 Method of accelerated testing of illuminated device components August 9, 2004
7122809 Charged beam writing method and writing tool December 2, 2004
7119877 Exposure apparatus including a non-contact utilities transfer assembly November 30, 2004
7117063 Sorting a group of integrated circuit devices for those devices requiring special testing September 29, 2005
7109501 Charged particle beam lithography system, pattern drawing method, and method of manufacturing semiconductor device October 7, 2004
7109498 Radiation source, lithographic apparatus, and device manufacturing method September 30, 2004
7105845 Liquid crystal alignment using electron beam exposure July 2, 2004
7105837 Lithographic apparatus, device manufacturing method and radiation system May 13, 2004
7102146 Dose cup located near bend in final energy filter of serial implanter for closed loop dose control June 3, 2004
7102145 System and method for improving spatial resolution of electron holography October 25, 2004
7102144 Particle beam irradiation apparatus, treatment planning unit, and particle beam irradiation method May 11, 2004
7098465 Integrated inert gas for electromagnetic energy spot curing system June 25, 2004
7095036 Electron beam lithography apparatus using a patterned emitter and method of fabricating the patterned emitter March 10, 2004
7095035 Demagnification measurement method for charged particle beam exposure apparatus, stage phase measurement method for charged particle beam exposure apparatus, control method for charged particle beam exposure apparatus, and charged particle beam exposure aDecember 23, 2003
7094451 Chemical functionalization of material surfaces using optical energy and chemicals November 7, 2002
7094312 Focused particle beam systems and methods using a tilt column April 29, 2002
7092068 Reticle, exposure monitoring method, exposure method and manufacturing method for semiconductor device November 26, 2003
7091507 Light generator and exposure apparatus February 17, 2005
7091484 Method and apparatus for crystal analysis November 12, 2004
7087913 Ion implanter electrodes October 29, 2003
7087912 Ion beam irradiation apparatus for suppressing charge up of substrate and method for the same December 3, 2002
7084414 Charged particle beamlet exposure system May 27, 2004
7084411 Pattern-definition device for maskless particle-beam exposure apparatus October 27, 2004
7078716 Large area electron source January 27, 2004
7078715 Lithographic apparatus and apparatus adjustment method August 11, 2004
7078712 In-situ monitoring on an ion implanter March 18, 2004
7067829 Power sag detection and control in ion implanting system November 23, 2004
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