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Your search returned 35 patents.
( 148/DIG.137 in Current US Classification )
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Patent IDTitleDate Filed
5173452 Process for the vapor deposition of polysilanes photoresists January 2, 1991
5171718 Method for forming a fine pattern by using a patterned resist layer January 9, 1991
5157003 Method of etching isolation and alignment mark regions using a single resist mask November 27, 1991
5106786 Thin coatings for use in semiconductor integrated circuits and processes as antireflection coatings consisting of tungsten silicide October 23, 1989
5093283 Method of manufacturing a semiconductor device May 16, 1991
5066616 Method for improving photoresist on wafers by applying fluid layer of liquid solvent September 7, 1990
5066615 Photolithographic processes using thin coatings of refractory metal silicon nitrides as antireflection layers August 6, 1990
5013689 Method of forming a passivation film January 18, 1990
4997869 Production of electronic coatings by spin coating a partially fluorinated polyimide composition October 11, 1988
4985374 Making a semiconductor device with ammonia treatment of photoresist June 27, 1990
4980317 Method of producing integrated semiconductor structures comprising field-effect transistors with channel lengths in the submicron range using a three-layer resist system March 21, 1989
4952528 Photolithographic method for manufacturing semiconductor wiring patterns October 4, 1989
4900696 Method for patterning photo resist film December 14, 1988
4845053 Flame ashing process for stripping photoresist January 25, 1988
4803181 Process for forming sub-micrometer patterns using silylation of resist side walls March 17, 1987
4771017 Patterning process June 23, 1987
4767723 Process for making self-aligning thin film transistors October 30, 1987
4748132 Micro fabrication process for semiconductor structure using coherent electron beams December 15, 1986
4500628 Process of making solid state devices using silicon containing organometallic plasma developed resists June 27, 1983
4311533 Method of making self-aligned differently doped regions by controlled thermal flow of photoresist layer June 20, 1980
4253888 Pretreatment of photoresist masking layers resulting in higher temperature device processing June 11, 1979
4231811 Variable thickness self-aligned photoresist process September 13, 1979
4173063 Fabrication of a semiconductor component element having a Schottky contact and little series resistance utilizing special masking in combination with ion implantation June 30, 1977
4038110 Planarization of integrated circuit surfaces through selective photoresist masking June 14, 1976
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